Atomic Force Microscopy (AFM) systems are crucial in 2D materials research, as they allow for experiments and measurements to be taken of materials on the atomic scale. However, while existing AFM systems have precise positioning of the scanning components, they lack the ability to precisely control the rotation of the sample with respect to the scanner. Rotation-enabled Multi-tip Active Probe (ReMAP) AFM brings this capability. This research will encompass mechanical design of the system, characterizing the electromechanical elements, developing and integrating the electronics hardware (piezo controllers, lock-in amplifier, etc.), and developing the controls software.

I’m excited to dive deeper into this research project as a part of the SuperUROP program to further explore mechatronics and precision controls.