Max Joseph Ockner
MIT EECS - Analog Devices Undergraduate Research and Innovation Scholar
Time-resolved Thermal Imaging of GaN Transistors
Tomas A. Palacios
My goal is to upgrade the Palacios groups thermo-reflectance microscope so that it achieves better than 200ns of temporal resolution. I will then use the thermo-reflectance microscope to measure the thermal behavior of GaN transistors. Of particular interest is the temperature distribution of GaN devices in the presence of sub-micrometer drain pulses, as this will suggest optimal device configurations for high frequency performance.
I have worked with Prof. Palacios at MIT on time-resolved thermo-reflectance microscopy. Supervised by Prof. Allan Adams, I investigated non-uniform black string solutions to Einsteins equations in 5-dimensional Anti de Sitter space.