The atomic-force microscope (AFM) is a powerful tool that produces images in the nanoscale world. Currently, large-range AFMs are capable of producing 8-10 images per second. But to attain truly real-time imaging speeds, the system must be improved so that it can produce at least 25 frames per second without reducing the size of the area being imaged. My project focuses on improving the existing implementation of an AFM faster more compact and the electronics system more robust to noise. To increase imaging speed without risking damage to the cantilever probe or the sample, a new controller must be designed with a fast response and little error in the actuation of the piezos controlling the probe.

I am participating in SuperUROP because I would like to apply the concepts from classes I’ve taken to a longer-term research project. As an electrical engineering major and mechanical engineering minor, I hope to combine what I’ ve learned in both disciplines in a meaningful way.